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Electronics and semiconductor engineering exercise 1 (0)

5 VÄGA HEA
Punktid
Tallinn University  of  Technology
Department of Electrical  Engineering
ELECTRONICS AND 
SEMICONDUCTOR  ENGINEERING
Exercises
Linear circuits
Student: xxxxxxxx
Codexxxxxx
Group: xxxxxx
TALLINN
xxxx
1.1  RL- Circuit
L1
Uout=4V
V1
100mH 
232.5 Vrms 
R1
5kHz 
54Ω
-89° 
Figure  .1: RL-circuit
Figure 1.: Input and  load   voltage
Figure 1.:  Frequency  response
Figure 1.: Frequency response
         Comparative  data table 
Calculated   Experiment
Quantity
value
al value
Uamp,V
328
327,98
I, A
0,074
0,074
Uout,V
4
3,99
UL,V
232,5
231,9
ϕ
-89
-89
∆, s
-0,000049
-0,000050
A, dB
-35,2
-35,3
Calculations
f=5 kHz  
L= 100 mH
R= 54 Ω 
Uout= 4 V
 
  
Conclusion
There  are only slight  differences , which may be caused by experimental and calculation errors 
but otherwise calculated and experimented results are very  similar .
1.2  RC-Circuit
C1
Uout=4V
1uF 
V1
R1
4.64 Vrms 
54Ω
5kHz 
30° 

Figure 2.1: RC-circuit
Figure 2.2: Input and load voltage
Figure 2.3: Frequency response
Figure 2.4: Frequency response
        Comparative data table 2
Calculated  Experiment
Quantity
value
al value
Uamp,V
6,56
6,55
I, A
0,074
0,074
Uout,V
4
3,99
UC,V
2,36
2,36
ϕ
30
30,52
∆, s
-0,000017
-0,000018
A, dB
-1,1
-1,3
Calculations
C= 1 µF
R= 54 Ω 
Uout= 4 V
f= 5 kHz
Us= I ∙ Z
 
 
 
Conclusion
Experimental and calculated results are very similar. The slight difference may be caused by 
errors in calculations or experimental circuit.
1.3 RLC-Circuit
L1
C1
Uout=4V
100mH 
1uF 
V1
R1
230.16 Vrms 
54Ω
5kHz 
-89° 

Figure 3.1: RLC-circuit
Figure 3.2: Input and load voltage
Figure 3.3: Frequency response
Figure 3.4: Frequency response
        Comparative data table 3
Calculated  Experiment
Quantity
value
al value
Uamp,V
325,5
325,47
I, A
0,074
0,074
Uout,V
4
3,99
UL,V
232,5
232,48
UC,V
2,36
2,35
ϕ
-89
-89
∆, s
-0,000049
-0,000050
A, dB
-35,08
-35,02
Calculations
C= 1 µF
L=100 mH
R= 54 Ω 
Uout= 4 V
f= 5 kHz
Us= I ∙ Z
 
 
 
Conclusion
Experimental and calculated results are very similar. The slight difference may be caused by 
errors in calculations or experimental circuit.
1.4
 Series  resonant  circuit
L1
C1
1.013mH
V1
IC=0A
1uF 
Uout=4V
3.996 Vrms 
R1
54Ω
5kHz 
0° 
Figure 4.1: Series resonant circuit
Figure 4.2: Input and load voltages(Us=Uout because XC=XL) 
Figure 4.3: Frequency response
Figure 4.4: Frequency response
   Comparative data table 4
Calculated  Experiment
Quantity
value
al value
Uamp,V
5,65
5,65
I, A
0,074
0,74
Uout,V
4
3,99
UL,V
2,355
2,356
UC,V
2,355
2,355
ϕ
0
0,009
∆, s
0
0
A, dB
0
0
Calculations
C= 1 µF
R= 54 Ω 
Uout= 4 V
f= 5 kHz
Us= I ∙ Z
 
 
 
Conclusion
Experimental and calculated results are very similar. The slight difference may be caused by 
errors in calculations or experimental circuit. UL=UC because of the voltage resonance.
1.5 Parallel  resonant circuit
Uout=4V
V1
L1
3.996 Vrms 
1.013mH
C1
R1
1uF 
54Ω
5kHz 
IC=0A
0° 
Figure 5.1: Parallel resonant circuit
Figure 5.2: Input and load voltage (US=Uout)
Figure 5.3: Frequency response
Figure 5.4: Frequency response
   Comparative data table 5
Calculated  Experiment
Quantity
value
al value
Uamp,V
5,65
5,65
I, A
0,074
0,74
Uout,V
4
3,99
UL,V
3,99
3,99
UC,V
3,99
3,99
IL
0,126
0,126
IC
0,126
0,126
ϕ
0
0
∆, s
0
0
A, dB
0
0
Calculations
C= 1 µF
R= 54 Ω 
Uout= 4 V
f= 5 kHz
Us= I ∙ Z
 
 bacause of the prallel circuit
 
 
Conclusion
Experimental and calculated results are very similar. The slight difference may be caused by 
errors in calculations or experimental circuit. IL=IC because of the  current  resonance.
Vasakule Paremale
Electronics and semiconductor engineering exercise 1 #1 Electronics and semiconductor engineering exercise 1 #2 Electronics and semiconductor engineering exercise 1 #3 Electronics and semiconductor engineering exercise 1 #4 Electronics and semiconductor engineering exercise 1 #5 Electronics and semiconductor engineering exercise 1 #6 Electronics and semiconductor engineering exercise 1 #7 Electronics and semiconductor engineering exercise 1 #8 Electronics and semiconductor engineering exercise 1 #9
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